UV-VIS-NIR Integrating Sphere Spectrophotometer
Series QPI-IRRM (250–1700nm)
Benchtop UV-Vis-NIR Spectrophotometer
UV-Vis-NIR Spectrometer with Integrating Sphere
Dual-Beam UV-Vis-NIR Spectrophotometer
Full-Spectrum Optical Transmittance Spectrophotometer
Wide-Band UV-Vis-NIR Spectrophotometer
Diffuse Reflectance & Transmission Spectrophotometer
High-Performance UV-Vis-NIR Spectrometer
Reflectance Meter
Infrared Reflectance Meter
Solar Reflectance Meter
Reflectance Spectrophotometer
Reflective Color Spectrophotometer
Roofing Reflectance Meter
Desktop Reflectance Meter
ASTM E97 ASTM D1347 ASTM D4212
ISO 2814 ISO 3905 ISO 3906
ISO 6504-1 ISO 7724 DIN5033
BSI 13900-D4

Product Description:

Qualtech Products Industry QPI‑IRRM Series UV‑VIS‑NIR Infrared Reflectance Meter is a high‑accuracy UV‑VIS‑NIR High-Precision Reflectance Spectrophotometer engineered for professional laboratories, optical research facilities, and industrial quality‑control environments. Designed to measure surface reflectance across the 250 nm to 1700 nm spectrum, this Surface Reflectance Measurement Instrument delivers precise, repeatable, and calibration‑stable results for a wide range of materials including solar coatings, electronic board finishes, silicon wafers, metallic mirrors, pigments, paint films, foils, plastics, ceramics, textiles, powders, pastes, paper, cardboard, wood, and engineered surfaces.

Built around a dual‑measurement architecture, the Infrared Reflectance Analyzer combines a 45° directional reflectance camera with an 8° & 90° integrating sphere featuring >98% internal reflection, enabling both directional and diffuse reflectance evaluation with exceptional accuracy. With 1 nm wavelength interval resolution, 1% repeatability, and measurement times from 1 to 10 seconds, this Spectral Reflectance Meter provides fast, reliable data for optical performance evaluation and material development.

Advanced UV‑VIS‑NIR Reflectance Technology

The Infrared Reflectance Meter captures the full spectral behavior of a surface, generating detailed Spectral Reflectance Curves essential for analyzing:

• Infrared reflectance behavior

• UV‑VIS‑NIR spectral response

• Coating uniformity and thickness

• Surface treatment effectiveness

• Material absorption and scattering

• Reflective color characteristics

Reflectance is measured at 45°, 8°, and 90° geometries, allowing engineers to evaluate both directional and diffuse reflection under controlled optical conditions.

High‑Precision Optical Measurement System

The Infrared Reflectance Spectrophotometer integrates:

• 45° high‑precision reflectance camera

• 8° & 90° integrating sphere (>98% reflection)

• Advanced infrared/visible/UV light source

• 1 nm wavelength interval resolution

• Automatic calibration with certified reference standard

• Instant measurement cycles (1–10 seconds)

• 1% accuracy and 1% repeatability

• Optional custom wavelength configurations

This optical system ensures stable, repeatable measurements suitable for both laboratory research and industrial production environments.

Model Range – UV‑VIS‑NIR Reflectance Measurement Line

Infrared Reflectance Meter 250–800 nm

UV‑VIS reflectance analysis for coatings, pigments, and optical materials requiring near‑UV evaluation.

Infrared Reflectance Meter 400–1000 nm

VIS‑NIR reflectance measurement for solar coatings, industrial surfaces, and general optical testing.

Infrared Reflectance Meter 900–1700 nm

Deep‑NIR reflectance analysis for semiconductor materials, silicon wafers, and advanced optical substrates.

All models support custom wavelength configurations for specialized applications.

Spectral & Colorimetric Analysis Software

The Reflectance Measurement Software provides:

• Real‑time spectral reflectance curves

• Lab and XYZ colorimetric reflectance analysis

• Multi‑sample comparison tools

• Data export (CSV, PDF, image formats)

• Network storage integration

• Automated reporting and documentation

• Long‑term data archiving and sharing

Engineers can instantly visualize, compare and document reflectance behavior across the full UV‑VIS‑NIR spectrum.

Designed for Engineering Precision

The Infrared Reflectance Meter combines advanced optical engineering with practical usability:

• Intuitive menu navigation

• Ergonomic sample handling

• Fast measurement cycles

• Robust industrial chassis

• Seamless PC connectivity

• Reliable long‑term performance

Whether used in R&D, production quality control, or optical material development, this professional UV‑VIS‑NIR Reflectance Spectrophotometer delivers the precision, stability, and analytical depth required by modern engineering workflows.

This professional UV-VIS High-Precision Reflectance Meter is designed and engineered in accordance with international test standards including:

• ASTM E97 (Standard Test Methods for Directional Reflectance Factor, 45-Deg 0-Deg, of Opaque Specimens by Broad-Band Filter Feflectometry)
• ASTM D1347 (Standard Test Method for Color and Color-Difference Measurement by Tristimulus Colorimetry)
• ISO 2814 (Paints and varnishes — Comparison of contrast ratio (hiding power) of paints of the same type and colour)
• ISO 3905 (Paints and varnishes — Determination of contrast ratio (opacity) of light coloured paints at a fixed spreading rate (using black and white charts))
• ISO 3906 (Paints and varnishes — Determination of contrast ratio (opacity) of light coloured paints at a fixed spreading rate (using polyester film))
• ISO 6504-1 (Paints and varnishes — Determination of hiding power — Part 1: Kubelka-Munk method for white and light-coloured paints)
• ISO 7724 (Paints and varnishes — Colorimetry — Part 1: Principles)
• DIN 5033 (Colorimetry; standard colorimetric systems)
• BSI 13900-D4