UV-VIS-NIR Integrating Sphere Spectrophotometer
Series QPI-IRRM (250–1700nm)
Benchtop UV-Vis-NIR Spectrophotometer
UV-Vis-NIR Spectrometer with Integrating Sphere
Dual-Beam UV-Vis-NIR Spectrophotometer
Full-Spectrum Optical Transmittance Spectrophotometer
Wide-Band UV-Vis-NIR Spectrophotometer
Diffuse Reflectance & Transmission Spectrophotometer
High-Performance UV-Vis-NIR Spectrometer
Reflektanzmeter
Infrarout-Reflektanzmeter
Solarreflektanzmeter
Reflektanz-Spektrospektrophotometer
Reflektiv Faarf-Spectrophotometer
Dachreflektanzmeter
Desktop-Reflektanzmeter
ASTM E97 ASTM D1347 ASTM D4212
ISO 2814 ISO 3905 ISO 3906
ISO 6504-1 ISO 7724 DIN5033
BSI 13900-D4

Produktbeschreiwung:

Qualtech Products Industry QPI‑IRRM Series UV‑VIS‑NIR Infrarout-Reflektanzmeter is a high‑accuracy UV‑VIS‑NIR High-Precision Reflectance Spectrophotometer engineered for professional laboratories, optical research facilities, and industrial quality‑control environments. Designed to measure surface reflectance across the 250 nm to 1700 nm spectrum, this Instrument fir d'Uewerflächreflektanzmoossung delivers precise, repeatable, and calibration‑stable results for a wide range of materials including solar coatings, electronic board finishes, silicon wafers, metallic mirrors, pigments, paint films, foils, plastics, ceramics, textiles, powders, pastes, paper, cardboard, wood, and engineered surfaces.

Built around a dual‑measurement architecture, the Infrared Reflectance Analyzer kombinéiert e 45° directional reflectance camera with an 8° & 90° integrating sphere featuring >98% internal reflection, enabling both directional and diffuse reflectance evaluation with exceptional accuracy. With 1 nm wavelength interval resolution, 1% repeatability, an measurement times from 1 to 10 seconds, dëst Spektralreflektanzmessinstrument provides fast, reliable data for optical performance evaluation and material development.

Advanced UV‑VIS‑NIR Reflectance Technology

Déi Infrarout-Reflektanzmeter captures the full spectral behavior of a surface, generating detailed Spectral Reflectance Curves essential for analyzing:

• Infrared reflectance behavior

• UV‑VIS‑NIR spectral response

• Coating uniformity and thickness

• Surface treatment effectiveness

• Material absorption and scattering

• Reflective color characteristics

Reflectance is measured at 45°, 8°, and 90° geometries, allowing engineers to evaluate both directional and diffuse reflection under controlled optical conditions.

High‑Precision Optical Measurement System

Déi Infrarout-Reflektanz-Spektrometer integrates:

• 45° high‑precision reflectance camera

• 8° & 90° integrating sphere (>98% reflection)

• Advanced infrared/visible/UV light source

• 1 nm wavelength interval resolution

• Automatic calibration with certified reference standard

• Instant measurement cycles (1–10 seconds)

• 1% accuracy and 1% repeatability

• Optional custom wavelength configurations

This optical system ensures stable, repeatable measurements suitable for both laboratory research and industrial production environments.

Model Range – UV‑VIS‑NIR Reflectance Measurement Line

Infrared Reflectance Meter 250–800 nm

UV‑VIS reflectance analysis for coatings, pigments, and optical materials requiring near‑UV evaluation.

Infrared Reflectance Meter 400–1000 nm

VIS‑NIR reflectance measurement for solar coatings, industrial surfaces, and general optical testing.

Infrared Reflectance Meter 900–1700 nm

Deep‑NIR reflectance analysis for semiconductor materials, silicon wafers, and advanced optical substrates.

All models support custom wavelength configurations for specialized applications.

Spectral & Colorimetric Analysis Software

Déi Reflectance Measurement Software provides:

• Real‑time spectral reflectance curves

• Lab and XYZ colorimetric reflectance analysis

• Multi‑sample comparison tools

• Data export (CSV, PDF, image formats)

• Network storage integration

• Automated reporting and documentation

• Long‑term data archiving and sharing

Engineers can instantly visualize, compare and document reflectance behavior across the full UV‑VIS‑NIR spectrum.

Designed for Engineering Precision

Déi Infrarout-Reflektanzmeter combines advanced optical engineering with practical usability:

• Intuitive menu navigation

• Ergonomic sample handling

• Fast measurement cycles

• Robust industrial chassis

• Seamless PC connectivity

• Reliable long‑term performance

Whether used in R&D, production quality control, or optical material development, this professional UV‑VIS‑NIR Reflectance Spectrophotometer delivers the precision, stability, and analytical depth required by modern engineering workflows.

This professional UV-VIS High-Precision Reflectance Meter is designed and engineered in accordance with international test standards including:

• ASTM E97 (Standardtestmethoden fir de Richtungsreflektanzfaktor (45°/0°) vun opak Proben duerch Breitbandfilter-Reflektometrie)
• ASTM D1347 (Standardtestmethod fir d'Faarf- a Faarferofsetzungsmessung duerch Tristimulus-Kolorimetrie)
• ISO 2814 (Faarwen a Lacke — Verglach vum Kontrastverhältnis (Ofdecktkraaft) vu Faarwen vum selwechten Typ a Faarf)
• ISO 3905 (Faarwen a Lacke — Bestëmmung vum Kontrastverhältnis (Opazitéit) vu hellfaarwege Faarwen bei enger fixter Ausbreedungsgeschwindegkeet (mat schwaarzen a wäisse Charts))
• ISO 3906 (Faarwen a Lacke — Bestëmmung vum Kontrastverhältnis (Opazitéit) vu hellfaarwege Faarwen bei enger fixter Ausbreedungsgeschwindegkeet (mat Polyesterfilm))
• ISO 6504-1 (Faarwen a Lacke — Bestëmmung vun der Ofdeckskraaft — Deel 1: Kubelka-Munk-Method fir wäiss a hellfaarweg Faarwen)
• ISO 7724 (Faarwen a Lacke — Kolorimetrie — Deel 1: Prinzipien)
• DIN 5033 (Kuelorimetrie; standard Kuelorimetresch Systemer)
• BSI 13900-D4