Produktbeschreiwung:
Qualtech Produkter Industrie Meter fir d'Uewerflächrauhheet ass e fortgeschrattenen Surface Profilometer fir direkt ze moossen d' Surface Texture of sample at the touch of a button at your laboratory and on the go.
Déi Surface Roughness of a sample is the texture of the sample surface specified as the vertical deviation of the sample surface from its ideal surface. With an increasing deviation the level of Rauheet increases and the sample surface shows more texture.
Dëse professionelle Meter fir d'Uewerflächrauhheet is designed and engineered offering the newest microchip technology combined with a large LCD Display, comfortable softtouch buttons, a durable high quality design, user-friendly application, user-friendly sample handling, non-destructive sample test method, high accuracy and high precision, an ergonomic design, reliable performance, longevity and much more.
Dëst Profilometer performs instant sample measurements and is suitable for a wide range of samples.
This Surface Roughness Meter is designed and engineered in accordance with international test standards including:
- ASTM D7127 (Standard Test Method for Measurement of Surface Roughness of Abrasive Blast Cleaned Metal Surfaces Using a Portable Stylus Instrument)
- ISO 4287:1997 (Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters)
- DIN 4768:1990-05 (Determination of values of surface roughness parameters Rₐ, Rz, Rₘₐₓ using electrical contact (stylus) instruments; concepts and measuring conditions)
Profilometer - Features:
- Déi neiste Mikrochip-Technologie
- Grousst faarwegt LCD-Display
- Instant Surface Roughness Measurement
- High-Resolution Detector
- Advanced Durable Technology
- Benotzerfrëndlech Uwendung
- Benotzerfrëndlech Probenhandhabung
- Extensiv Batterieliewensdauer
- Héich Präzisioun & Héich Widderhuelbarkeet
- Ergonomescht Design
- Zouverlässeg Leeschtung & Liewensdauer
- Engineered in accordance with international test standards including ASTM D7127, ISO 4287, DIN 4768
Rugosimeter – Specifications:
| Modell | QPI-SPM1800 | QPI-SPM2800 |
|---|---|---|
| Grousst LCD-Display | Jo | Jo |
| Teststandard | ASTM D7127 ISO 4287 DIN 4768 ANSI 1461 | ASTM D7127 ISO 4287 DIN 4768 ANSI 1461 |
| Moossberäich | 0.0 µm - 320 µm Ra 0.0 µm - 80.0 µm | Ra 0.05 - 10.0 µm Rz 0.1 - 50 µm |
| Measuring Parameters | Ra, Rq, Rz, Rt, Rp, Rv, RS, RSm, Ry, RSk, R3z, Rmax, Rpc, Rmr, Rku | Ra, Rz, Rq, Rt |
| Genauegkeet | ≤±10% | ≤±15% |
| Entscheedung | 0.01 µm <20 µm 0.02 µm <40 µm 0.04 µm <80 µm 0.08 µm <160 µm | 0.01 µm |
| Digital Filter | RC, PC-RC, Gauss, DP | |
| Stylus Radius | 5 µm Diamond Cone | 10 µm |
| Traversing Length Lt | 0.25mm, 0.80mm, 2.5mm | 0.25mm, 0,80mm, 2,5mm |
| Evaluation Length Ln | Ln=lr x n, n=1 - 5 | 1,25mm, 4.0mm, 5.0mm |
| Automatesch Kalibrasioun | Jo | Jo |
| Héich Genauegkeet & Héich Präzisioun | Jo | Jo |
| Rechargeable Battery | Jo | Jo |
| Extensiv Batterieliewensdauer | Jo | Jo |
| Ergonomescht Design | Jo | Jo |
| Zouverlässeg Leeschtung & Liewensdauer | Jo | Jo |
| Engineered in accordance with international test standards including ASTM D7127, ISO 4287, DIN 4768 | ||
Surface Roughness Meter – Included items:
- Professional Surface Roughness Meter
- Zousätz
- Qualitéitszertifikat
- Virsiichteg kalibréiert
- Kalibrasiounszertifikaat
- Benotzerhandbuch
- Erweidert Garantie
- Liewenslaang Ënnerstëtzung
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