UV-VIS-NIR Integrating Sphere Spectrophotometer
Series QPI-IRRM (250–1700nm)
Benchtop UV-Vis-NIR Spectrophotometer
UV-Vis-NIR Spectrometer with Integrating Sphere
Dual-Beam UV-Vis-NIR Spectrophotometer
Full-Spectrum Optical Transmittance Spectrophotometer
Wide-Band UV-Vis-NIR Spectrophotometer
Diffuse Reflectance & Transmission Spectrophotometer
High-Performance UV-Vis-NIR Spectrometer
Medidor de refletância
Medidor de refletância de infravermelhos
Medidor de refletância solar
Espectrofotómetro de refletância
Espectrofotómetro de cor por reflexão
Medidor de refletância de coberturas
Medidor de refletância de secretária
ASTM E97, ASTM D1347, ASTM D4212
ISO 2814, ISO 3905, ISO 3906
ISO 6504-1, ISO 7724, DIN 5033
BSI 13900-D4

Descrição do produto:

Qualtech Products Industry QPI‑IRRM Series UV‑VIS‑NIR Medidor de refletância de infravermelhos is a high‑accuracy UV‑VIS‑NIR High-Precision Reflectance Spectrophotometer engineered for professional laboratories, optical research facilities, and industrial quality‑control environments. Designed to measure surface reflectance across the 250 nm to 1700 nm spectrum, this Instrumento de medição da refletância superficial delivers precise, repeatable, and calibration‑stable results for a wide range of materials including solar coatings, electronic board finishes, silicon wafers, metallic mirrors, pigments, paint films, foils, plastics, ceramics, textiles, powders, pastes, paper, cardboard, wood, and engineered surfaces.

Built around a dual‑measurement architecture, the Infrared Reflectance Analyzer combina um 45° directional reflectance camera with an 8° & 90° integrating sphere featuring >98% internal reflection, enabling both directional and diffuse reflectance evaluation with exceptional accuracy. With 1 nm wavelength interval resolution, 1% repeatability, e measurement times from 1 to 10 seconds, isto Medidor de refletância espectral provides fast, reliable data for optical performance evaluation and material development.

Advanced UV‑VIS‑NIR Reflectance Technology

O Medidor de refletância de infravermelhos captures the full spectral behavior of a surface, generating detailed Spectral Reflectance Curves essential for analyzing:

• Infrared reflectance behavior

• UV‑VIS‑NIR spectral response

• Coating uniformity and thickness

• Surface treatment effectiveness

• Material absorption and scattering

• Reflective color characteristics

Reflectance is measured at 45°, 8°, and 90° geometries, allowing engineers to evaluate both directional and diffuse reflection under controlled optical conditions.

High‑Precision Optical Measurement System

O Espectrofotómetro de refletância no infravermelho integrates:

• 45° high‑precision reflectance camera

• 8° & 90° integrating sphere (>98% reflection)

• Advanced infrared/visible/UV light source

• 1 nm wavelength interval resolution

• Automatic calibration with certified reference standard

• Instant measurement cycles (1–10 seconds)

• 1% accuracy and 1% repeatability

• Optional custom wavelength configurations

This optical system ensures stable, repeatable measurements suitable for both laboratory research and industrial production environments.

Model Range – UV‑VIS‑NIR Reflectance Measurement Line

Infrared Reflectance Meter 250–800 nm

UV‑VIS reflectance analysis for coatings, pigments, and optical materials requiring near‑UV evaluation.

Infrared Reflectance Meter 400–1000 nm

VIS‑NIR reflectance measurement for solar coatings, industrial surfaces, and general optical testing.

Infrared Reflectance Meter 900–1700 nm

Deep‑NIR reflectance analysis for semiconductor materials, silicon wafers, and advanced optical substrates.

All models support custom wavelength configurations for specialized applications.

Spectral & Colorimetric Analysis Software

O Reflectance Measurement Software provides:

• Real‑time spectral reflectance curves

• Lab and XYZ colorimetric reflectance analysis

• Multi‑sample comparison tools

• Data export (CSV, PDF, image formats)

• Network storage integration

• Automated reporting and documentation

• Long‑term data archiving and sharing

Engineers can instantly visualize, compare and document reflectance behavior across the full UV‑VIS‑NIR spectrum.

Designed for Engineering Precision

O Medidor de refletância de infravermelhos combines advanced optical engineering with practical usability:

• Intuitive menu navigation

• Ergonomic sample handling

• Fast measurement cycles

• Robust industrial chassis

• Seamless PC connectivity

• Reliable long‑term performance

Whether used in R&D, production quality control, or optical material development, this professional UV‑VIS‑NIR Reflectance Spectrophotometer delivers the precision, stability, and analytical depth required by modern engineering workflows.

This professional UV-VIS High-Precision Reflectance Meter is designed and engineered in accordance with international test standards including:

• ASTM E97 (Métodos de ensaio normalizados para o fator de refletância direcional, 45°-0°, de amostras opacas por reflectometria com filtro de banda larga)
• ASTM D1347 (Método de ensaio normalizado para a medição da cor e da diferença de cor por colorimetria tristimular)
• ISO 2814 (Tintas e vernizes — Comparação da relação de contraste (poder de cobertura) de tintas do mesmo tipo e cor)
• ISO 3905 (Tintas e vernizes — Determinação da relação de contraste (opacidade) de tintas de cor clara a uma taxa de aplicação fixa (utilizando tabelas a preto e branco))
• ISO 3906 (Tintas e vernizes — Determinação da relação de contraste (opacidade) de tintas de cor clara a uma taxa de espalhamento fixa (utilizando película de poliéster))
• ISO 6504-1 (Tintas e vernizes — Determinação do poder de cobertura — Parte 1: Método de Kubelka-Munk para tintas brancas e de cores claras)
• ISO 7724 (Tintas e vernizes — Colorimetria — Parte 1: Princípios)
• DIN 5033 (Colorimetria; sistemas colorimétricos normalizados)
• BSI 13900-D4