Disgrifiad o'r cynnyrch:
Diwydiant Cynhyrchion Qualtech Mesurydd Adlewyrchiad Is-goch yn weithiwr proffesiynol Desktop Reflectance Measurement Device with automatic calibration to measure the Reflectance a'r Reflective Color in the Infrared Wavelength Range of samples and sample surfaces including solar panels, electronic board coatings, silicon wafers, surface coatings, aluminum mirrors, pigments, glass mirrors, paint films, foils, paper, cardboard, plastic, pastes, powders, ceramics, textiles, glass, wood, metal, ink, paint and related sample materials.
Hwn Solar Reflectance Meter yn weithiwr proffesiynol Reflectance Measurement Instrument ac Reflectance Measurement Spectrophotometer with a Reflectance Measurement Sensors, an Optical Integrative Reflective Sphere, a seamless PC Connectivity and PC Software and includes a Calibration Standard to ensure the high accuracy of your sample measurements at the touch of a button.
Reflectance is the capability of a surface to reflect Incident Light with a specified Light Wavelength at a specified Angle of Incidence and a specified Polarization.
Y Reflectance Spectrum indicates the Wavelength of the Reflection and is presented as a Spectral Reflectance Curve neu a Spectral Reflectance Graph.
Incident Light is Light which falls on a surface with a specific Light Wavelength, it can be Natural Light neu Artificial Light, for example, an Infrared Light Source.
This high-precision Mesurydd Adlewyrchiad Is-goch ac Infrared Reflectance Spectrophotometer offers different Reflectance Measurement Programs and seamless PC-Connectivity and a PC Software to conveniently analyze Reflectance Measurement Results and export and store data on your Laboratory PC Network or on your Laptop for additional data analysis, data documentation, data presentation, data storage, data sharing and much more.
Y proffesiynol hwn Infrared Reflectance Spectrophotometer is designed and engineered offering the newest microchip technology combined with a high-precision Reflectance Measurement Camera, instant Reflectance Measurement, instant Reflectance Analysis, high-precision Reflectance Camera 45°, Reflectance Integrating Sphere 8° and 90°, wide range of Automatic Online Industrial Detection Programs, Spectral Reflectance Color Measurement and Spectrophotometry, L*a*b Reflectance Color Measurement, XYZ Reflectance Color Measurement, advanced high-precision Light Source, Sample Measurement Wavelength 250nm - 1700nm, optional Wavelength Customization available, user-friendly Application, intuitive Menu Navigation, a user-friendly Sample Handling, an ergonomic Design, reliable Performance, a seamless PC-Connectivity and PC-Software for advanced data management, sample data analysis, data presentation, data sharing and much more.
This professional Solar Reflectance Meter is designed and engineered in accordance with international test standards including:
- ASTM E97 (Standard Test Methods for Directional Reflectance Factor, 45-Deg 0-Deg, of Opaque Specimens by Broad-Band Filter Feflectometry)
- ASTM D1347 (Standard Test Method for Color and Color-Difference Measurement by Tristimulus Colorimetry)
- ISO 2814 (Paints and varnishes — Comparison of contrast ratio (hiding power) of paints of the same type and colour)
- ISO 3905 (Paints and varnishes — Determination of contrast ratio (opacity) of light coloured paints at a fixed spreading rate (using black and white charts))
- ISO 3906 (Paints and varnishes — Determination of contrast ratio (opacity) of light coloured paints at a fixed spreading rate (using polyester film))
- ISO 6504-1 (Paints and varnishes — Determination of hiding power — Part 1: Kubelka-Munk method for white and light-coloured paints)
- ISO 7724 (Paints and varnishes — Colorimetry — Part 1: Principles)
- DIN 5033 (Colorimetry; standard colorimetric systems)
- BSI 13900-D4
Solar Reflectance Meter - Application:
Y Mesurydd Adlewyrchiad Is-goch yn weithiwr proffesiynol Desktop Reflectance Measurement Device with automatic calibration to measure the Reflectance and the Reflective Color in the Infrared Wavelength Range of samples and sample surfaces including solar panels, electronic board coatings, silicon wafers, surface coatings, aluminum mirrors, pigments, glass mirrors, paint films, foils, paper, cardboard, plastic, pastes, powders, ceramics, textiles, glass, wood, metal, ink, paint and related sample materials.
Hwn Solar Reflectance Meter yw un uwch Reflectance Measurement Instrument ac Reflectance Measurement Spectrophotometer with two Reflectance Measurement Sensors, a seamless PC Connectivity and PC Software and includes a Calibration Standard to ensure the high accuracy of your sample measurements at the touch of a button.
Reflectance is the capability of a surface to reflect Incident Light with a specified Light Wavelength, at a specified Angle of Incidence and a specified Polarization.
Y Reflectance Spectrum indicates the Wavelength of the Reflection and is presented as a Spectral Reflectance Curve neu a Spectral Reflectance Graph.
Incident Light is Light which falls on a surface with a specific Light Wavelength, it can be Natural Light neu Artificial Light.
The advanced and professional Reflectance Measurement ac Reflectance Analysis includes Infrared Reflectance Spectrum Measurement, Color Selection for Color Samples, Spectral Reflectance Measurement of solid samples and powder samples, Reflectivity Measurement of Reflective Film and Non-Reflective Film, Standard Reflectance Measurement, Optical Lens Reflectivity Measurement, Phosphor Detection, Solar Panel Measurement, Textile Measurement and Fabric Measurement, Chemical Reflectance Monitoring, Chemical Analysis and much more.
Reflective Color Spectrophotometer - Features:
- Technoleg Micro-sglodyn ddiweddaraf
- Newest Light Source Technology
- Newest Camera Technology
- High-Precision Reflectance Camera 45°
- Reflectance Integrating Sphere 8° & 90°
- Instant Reflectance Measurement
- Instant Reflectance Analysis
- Infrared Reflectance Spectrum Analysis
- Color Selection & Analysis of Color Samples
- Spectral Reflectance Analysis of solid samples & powder samples
- Reflectivity Measurement of Reflective Film & Non-Reflective Film
- Standard Reflectance Measurement
- Optical Lens Reflectivity Measurement
- Phosphor Detection
- Solar Panel Analysis
- Textile Analysis & Fabric Analysis
- Chemical Reflectance Monitoring
- Chemical Analysis
- Determine Opacity & Hiding Power with the touch of a button
- Calibru Awtomatig
- Cais hawdd ei ddefnyddio
- Trin Samplau Hawdd ei Ddefnyddio
- Llywio Deheuol Greddfol
- Cysylltedd PC a Meddalwedd PC di-dor
- Cais Proffesiynol
- Cywirdeb Uchel a Manwl-gywirdeb Uchel
- Dyluniad Ergonomig a Pherfformiad Dibynadwy
- Engineered in accordance with international test standards including ASTM 97, ASTM 1347, ASTM D4212, ISO 2814, ISO 3905, ISO 3906, ISO 6504-1, ISO 7724, DIN5033, BSI 13900-D4
Mesurydd Adlewyrchiad Is-goch – Manylebau:
| Model | QPI-IRRM1800 | QPI-IRRM2800 | QPI-IRRM3800 |
|---|---|---|---|
| Amrediad mesur | 0 - 100.0% | 0 - 100.0% | 0 - 100.0% |
| Tonfedd mesur | 250nm - 800nm | 400nm - 1000nm | 900nm - 1700nm |
| Customized Measurement Wavelength | Optional Available | Optional Available | Optional Available |
| Measuring Method | High-Precision Reflectance Camera 45° Reflectance Integrating Sphere 8° & 90° | High-Precision Reflectance Camera 45° Reflectance Integrating Sphere 8° & 90° | High-Precision Reflectance Camera 45° Reflectance Integrating Sphere 8° & 90° |
| Wavelength Interval | 1nm | 1nm | 1nm |
| Measurement Time | 2s | 1s | 10s |
| Cywirdeb | 1% | 1% | 1% |
| Repeatability | 1% | 1% | 1% |
| Reflection of Integrated Sphere | >98% | >98% | >98% |
| Newest Light Source Technology | Ie | Ie | Ie |
| High Precision Photo Sensors | Ie | Ie | Ie |
| Calibru Awtomatig | Ie | Ie | Ie |
| Manwl uchel a Chywirdeb uchel | Ie | Ie | Ie |
| Cais hawdd ei ddefnyddio | Ie | Ie | Ie |
| Trin Samplau Hawdd ei Ddefnyddio | Ie | Ie | Ie |
| Llywio Deheuol Greddfol | Ie | Ie | Ie |
| Cysylltedd PC a Meddalwedd PC di-dor | Ie | Ie | Ie |
| Oes Batri Hirfaith | Ie | Ie | Ie |
| Dyluniad Ergonomig a Pherfformiad Dibynadwy | Ie | Ie | Ie |
| Engineered in accordance with international test standards ASTM 97, ASTM 1347, ASTM D4212, ISO 2814, ISO 3905, ISO 3906, ISO 6504-1, ISO 7724, DIN5033, BSI 13900-D4 | |||
Infrared Reflectance & Opacity Spectrophotometer – Eitemau wedi'u cynnwys:
- Infrared Reflectance Meter & Infrared Opacity Spectrophotometer
- Calibration Standard
- Graddnodedig yn ofalus
- Tystysgrif Graddnodi
- Tystysgrif Ansawdd
- Gwarant estynedig
- Cymorth am oes
- Llawlyfr Defnyddiwr
Cewch wybodaeth nawr am gynhyrchion, prisiau, cymorth technegol a gwasanaethau proffesiynol.
Bydd un o'n harbenigwyr yn ateb eich ymholiad cyn bo hir. Fel arall, cysylltwch â ni drwy fanylion y cwmni yn yr Unol Daleithiau, yn Awstralia neu yn y DU.
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